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Data Augmentation With CycleGAN to Build a Classifier for Novel Defects From the Dicing Stage of Semiconductor Package Assembly.
Chin Ta Wu
Ching-Shih Tsou
Shing Han Li
Published in:
IEEE Access (2023)
Keyphrases
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training data
database
data quality
data collection
raw data
training examples
data analysis
data sets
data processing
input data
data sources
probability distribution
feature space
statistical analysis
feature selection
synthetic data
data mining
original data
image data
small number
data mining techniques
active learning
data structure
missing values
neural network