Data Augmentation With CycleGAN to Build a Classifier for Novel Defects From the Dicing Stage of Semiconductor Package Assembly.
Chin Ta WuChing-Shih TsouShing Han LiPublished in: IEEE Access (2023)
Keyphrases
- training data
- database
- data quality
- data collection
- raw data
- training examples
- data analysis
- data sets
- data processing
- input data
- data sources
- probability distribution
- feature space
- statistical analysis
- feature selection
- synthetic data
- data mining
- original data
- image data
- small number
- data mining techniques
- active learning
- data structure
- missing values
- neural network