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Process Variation's Effect on Various Threshold Voltage Assignments in 6T SRAM Designs Using 12nm FinFET Technology.

Umme Rani IrinSajib BaruaMd Minhajul AzmirTasnuva HassanDewan Mohammed
Published in: CCWC (2023)
Keyphrases
  • case study
  • rapid development
  • nm technology
  • data sets
  • neural network
  • information systems
  • computer systems
  • process model
  • personal computer
  • data transmission