Novel Complete Probabilistic Models of Random Variation in High Frequency Performance of Nanoscale MOSFET.
Rawid BanchuinPublished in: J. Electr. Comput. Eng. (2013)
Keyphrases
- high frequency
- probabilistic model
- low frequency
- visual quality
- high resolution
- wavelet transform
- graphical models
- subband
- high frequencies
- wavelet coefficients
- low pass
- multi resolution analysis
- wavelet domain
- phase shifting
- discrete wavelet transform
- image processing
- low bit rate coding
- expectation maximization
- bayesian networks
- power supply
- contourlet transform
- wavelet decomposition
- super resolution