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Statistical modeling of MOS transistor mismatch based on the parameters' autocorrelation function.
Massimo Conti
Paolo Crippa
Simone Orcioni
Claudio Turchetti
Published in:
ISCAS (6) (1999)
Keyphrases
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statistical modeling
autocorrelation function
statistical models
parameter estimation
high speed
machine learning
least squares
maximum likelihood
expectation maximization
statistical model
correlation coefficient
floating gate
feature selection
image segmentation
input image
power spectrum