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Holistic Device Modeling: Toward a Unified MOSFET Model Including Variability, Aging, and Extreme Operating Conditions.

Mustafa Berke Yelten
Published in: IEEE Trans. Circuits Syst. II Express Briefs (2022)
Keyphrases
  • operating conditions
  • real time
  • experimental data
  • feature selection
  • mathematical model
  • prior knowledge
  • support vector machine
  • simulation model
  • measured data