Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter Measurement Systems.
Aihua WuXingchang FuChen LiuChong LiYibang WangFaguo LiangPeng LuanPublished in: IEEE Trans. Instrum. Meas. (2020)
Keyphrases
- optimal design
- management system
- distributed systems
- water supply
- embedded systems
- learning systems
- neural network
- operating environment
- real time
- complex systems
- noisy data
- parameter space
- intelligent systems
- mobile devices
- additive noise
- noise model
- processing capabilities
- random noise
- constraint handling
- expert systems
- residual error