Login / Signup
Modeling of Resistance in FinFET Local Interconnect.
Ning Lu
Richard A. Wachnik
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2015)
Keyphrases
</>
feature extraction
face recognition
high speed
image processing
feature selection
high level
genetic algorithm
artificial intelligence
data model
modeling language
modeling method