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Modeling of Resistance in FinFET Local Interconnect.

Ning LuRichard A. Wachnik
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2015)
Keyphrases
  • feature extraction
  • face recognition
  • high speed
  • image processing
  • feature selection
  • high level
  • genetic algorithm
  • artificial intelligence
  • data model
  • modeling language
  • modeling method