Multi-Coding ECC Algorithm Based on 3D Charge Trap NAND Flash Hot Region Cell Prediction.
Yiyang JiangQi WangQianhui LiZongliang HuoPublished in: IEEE Commun. Lett. (2020)
Keyphrases
- detection algorithm
- learning algorithm
- worst case
- prediction algorithm
- optimization algorithm
- np hard
- dynamic programming
- computational complexity
- region of interest
- prediction error
- objective function
- computational cost
- cost function
- segmentation algorithm
- k means
- probabilistic model
- low cost
- simulated annealing
- matching algorithm