Extraction of scalable electrical model for a SOI JFET using BSIM3 model.

Simona A. Cozzi Lorenzo Labate Roberto Stella

Published in: Microelectron. J. (2013)

Keyphrases

computational model
probabilistic model
information systems
sensitivity analysis
mathematical model
real time
database
expert systems
formal model
experimental data
network model
parameter values
conceptual model
statistical model
theoretical analysis
em algorithm
input data
prior knowledge
high level
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