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Efficient Fine-Tuning of Neural Networks for Artifact Removal in Deep Learning for Inverse Imaging Problems.

Alice LucasSantiago López-TapiaRafael MolinaAggelos K. Katsaggelos
Published in: ICIP (2019)
Keyphrases
  • fine tuning
  • deep learning
  • neural network
  • viable alternative
  • machine learning
  • computer vision
  • pattern recognition
  • unsupervised learning
  • feature selection
  • high dimensional
  • unsupervised feature learning