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Efficient Fine-Tuning of Neural Networks for Artifact Removal in Deep Learning for Inverse Imaging Problems.
Alice Lucas
Santiago López-Tapia
Rafael Molina
Aggelos K. Katsaggelos
Published in:
ICIP (2019)
Keyphrases
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fine tuning
deep learning
neural network
viable alternative
machine learning
computer vision
pattern recognition
unsupervised learning
feature selection
high dimensional
unsupervised feature learning