A yield model for the evaluation of topologically constrained chip architectures.

Bruno Ciciani Giuseppe Iazeolla

Published in: ICCD (1989)

Keyphrases

probabilistic model
high level
mathematical model
prior knowledge
data sets
evaluation method
formal model
conceptual model
input data
low cost
management system
theoretical analysis
multi agent systems
statistical model
experimental data
machine learning
neural network
database
evaluation model
evaluation framework