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A methodology for validating artifact removal techniques for fNIRS.
Kevin T. Sweeney
Hasan Ayaz
Tomás E. Ward
Meltem Izzetoglu
Seán F. McLoone
Banu Onaral
Published in:
EMBC (2011)
Keyphrases
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expert systems
data mining
pattern recognition
design methodology
high level
high quality
object recognition
management system
theoretical framework
statistical methods