• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

Test Time Analysis for IEEE P1687.

Farrokh Ghani ZadeganUrban IngelssonGunnar CarlssonErik Larsson
Published in: Asian Test Symposium (2010)
Keyphrases
  • databases
  • statistical analysis
  • image analysis
  • comprehensive analysis
  • neural network
  • website
  • database systems
  • digital libraries
  • automatic analysis