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Automation of Yeast Pedigree Analysis.

John KoschwanezMark HollMichael McMurrayDaniel GottschlingDeirdre R. Meldrum
Published in: ICRA (2004)
Keyphrases
  • bayesian networks
  • statistical analysis
  • multiscale
  • high throughput
  • database
  • information systems
  • similarity measure
  • search algorithm
  • expert systems
  • high dimensional
  • image analysis