Atomic Defect Identification with Sparse Sampling and Deep Learning.

Michael C. Cao Jonathan Schwartz Huihuo Zheng Yi Jiang Robert Hovden Yimo Han

Published in: SMC (2021)

Keyphrases

deep learning
sparse sampling
unsupervised feature learning
unsupervised learning
machine learning
restricted boltzmann machine
deep architectures
mental models
weakly supervised
data sets
information retrieval
higher order
online learning
generative model
deep belief networks