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Predicting the process induced warpage of electronic packages using the P-V-T-C equation and the Taguchi method.

Shiang-Yu TengSheng-Jye Hwang
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • decision trees
  • data sets
  • multiscale
  • computer vision
  • feature selection
  • search algorithm
  • multiresolution
  • probability distribution
  • software engineering