Effort-Aware semi-Supervised just-in-Time defect prediction.
Weiwei LiWenzhou ZhangXiuyi JiaZhiqiu HuangPublished in: Inf. Softw. Technol. (2020)
Keyphrases
- semi supervised
- defect prediction
- semi supervised learning
- software repositories
- labeled data
- unsupervised learning
- supervised learning
- semi supervised classification
- unlabeled data
- multi view
- active learning
- software projects
- semi supervised clustering
- pairwise constraints
- co training
- subspace learning
- software systems
- artificial intelligence
- metric learning
- learning algorithm
- software engineering
- case study
- end users