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Analyzing the impact of radiation-induced failures in flash-based APSoC with and without fault tolerance techniques at CERN environment.

Lucas A. TambaraEduardo ChielleFernanda Lima KastensmidtGeorgios TsiligiannisSalvatore DanzecaMarkus BruggerA. Masi
Published in: Microelectron. Reliab. (2017)
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