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Dark Count Rate Modeling in Single-Photon Avalanche Diodes.

Aymeric PanglossePhilippe Martin-GonthierOlivier MarcelotCédric VirmontoisOlivier Saint-PéPierre Magnan
Published in: IEEE Trans. Circuits Syst. I Fundam. Theory Appl. (2020)
Keyphrases
  • artificial intelligence
  • monte carlo
  • modeling method
  • data sets
  • information retrieval
  • image processing
  • multiscale
  • video sequences
  • computational complexity
  • relational databases
  • modeling framework