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Low-voltage triggering SCRs for ESD protection in a 0.35 μm SiGe BiCMOS process.

Jizhi LiuYaohui ZengZhiwei LiuJianming ZhaoCheng HuiLiu Nie
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • collaborative learning
  • low voltage
  • pattern recognition
  • image processing
  • high speed
  • mixed signal