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A New Approach to Model the Effect of Topology on Testing Using Boundary Scan.
Farnaz Fotovatikhah
Bahareh Naraghi
Fatemeh Tavakoli
Mahdiar Ghadiry
Published in:
J. Electron. Test. (2015)
Keyphrases
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computational model
high level
input data
statistical model
experimental data
information retrieval
case study
objective function
cost function
probabilistic model
management system
graph cuts
theoretical framework
formal model