A parallel-in-time method for the transient simulation of SOI devices with drain current overshoots.
Gwo-Chung TaiCan E. KormanIsaak D. MayergoyzPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1994)
Keyphrases
- high precision
- significant improvement
- cost function
- computational cost
- detection method
- input data
- parallel implementation
- neural network
- fully automatic
- support vector machine svm
- theoretical analysis
- computationally efficient
- experimental evaluation
- prior knowledge
- pairwise
- high speed
- segmentation algorithm
- multiresolution
- mathematical model
- objective function
- parallel processing
- genetic algorithm