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Capacity control in linear classifiers for pattern recognition.

Isabelle GuyonVladimir VapnikBernhard E. BoserLéon BottouSara A. Solla
Published in: ICPR (2) (1992)
Keyphrases
  • linear classifiers
  • pattern recognition
  • multi class
  • linear classification
  • hyperplane
  • neural network
  • data sets
  • feature extraction
  • generalization error
  • support vector machine svm
  • missing data