Detailed Comparisons of Program, Erase and Data Retention Characteristics between P+- and N+-Poly SONOS NAND Flash Memory.
Victor Chao-Wei KuoChih-Ming ChaoChih-Kai KangLi-Wei LiuTzung-Bin HuangLiang-Tai KuoShi-Hsien ChenHoung-Chi WeiHann-Ping HwangSaysamone PittikounPublished in: MTDT (2006)