Noise, Hot Carrier and NBTI Reliability of MOSFETs.
Jae-Hyung JangHyuk-Min KwonHo-Young KwakSung-Kyu KwonSeon-Man HwangJong-Kwan ShinSeung-Yong SungYi-Sun ChungDa-Soon LeeHi-Deok LeePublished in: IEICE Trans. Electron. (2013)
Keyphrases
- noise level
- noisy data
- image noise
- noise reduction
- median filter
- random noise
- signal to noise ratio
- low snr
- low signal to noise ratio
- noise removal
- noise sensitivity
- real time
- sensor noise
- noise free
- noise model
- arbitrary shape
- additive noise
- maximum likelihood
- data structure
- training data
- image sequences
- artificial intelligence