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Characterization of fatigued Al lines by means of SThM and XRD: Analysis using fast Fourier transform.

R. F. SzelochPawel JanusJaroslaw SerafinczukP. M. SzecówkaGrzegorz Józwiak
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • image analysis
  • pattern analysis
  • spectral analysis
  • image processing
  • pattern recognition
  • feature space
  • fast fourier transform
  • short time fourier transform