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Electrical Characterization of the Backside Interface on BSI Global Shutter Pixels with Tungsten-Shield Test Structures on CDTI Process.

Célestin DoyenStéphane RicqPierre MagnanOlivier MarcelotMarios BarlasSébastien Place
Published in: Sensors (2020)
Keyphrases
  • information systems
  • data sets
  • process model
  • frame rate
  • database systems
  • user interface
  • control system
  • global information
  • interface design