Login / Signup
Design Margin Exploration of Spin-Transfer Torque RAM (STT-RAM) in Scaled Technologies.
Yiran Chen
Xiaobin Wang
Hai Li
Haiwen Xi
Yuan Yan
Wenzhong Zhu
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2010)
Keyphrases
</>
human factors
design considerations
design process
artificial intelligence
training data
support vector
design tools
data mining technology