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Superior Endurance Performance of 22-nm Embedded MRAM Technology.

V. B. NaikJ. H. LimK. YamaneD. ZengH. YangN. ThiyagarajahJ. H. KwonN. L. ChungR. ChaoT. LingK. Lee
Published in: IRPS (2019)
Keyphrases
  • case study
  • data processing
  • cost effective
  • design considerations
  • embedded systems
  • rapid development
  • database
  • high speed
  • data management
  • signal processing
  • computer systems
  • personal computer
  • cmos technology