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Low-Overhead Triple-Node-Upset Self-Recoverable Latch Design for Ultra-Dynamic Voltage Scaling Application.
Xin Chen
Yuxin Bai
Hao Cai
Congyi Zhu
Xinjie Zhou
Ying Zhang
Weiqiang Liu
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2024)
Keyphrases
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low overhead
high speed
data sets
multimedia
low cost
design process