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Applying Combinatorial Testing to the Siemens Suite.

Laleh Shikh Gholamhossein GhandehariMehra N. BorazjanyYu LeiRaghu KackerD. Richard Kuhn
Published in: ICST Workshops (2013)
Keyphrases
  • feature extraction
  • software testing
  • neural network
  • multiscale
  • database
  • data sets
  • image segmentation
  • training data
  • trade off
  • hidden markov models