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An improved scattering correction method for model analysis of cone-beam CT.

Guanyu KangYu HanXiaoqi XiLei LiShuangzhan YangLinlin ZhuMengnan LiuSiyu TanBin Yan
Published in: BIC (2022)
Keyphrases
  • image processing
  • em algorithm
  • statistical analysis
  • computer assisted
  • pattern analysis
  • cone beam ct