An event-driven transient simulation algorithm for MOS and bipolar circuits.
D. PatrickColin LydenPublished in: EURO-DAC (1990)
Keyphrases
- event driven
- dynamic programming
- optimization algorithm
- high accuracy
- detection algorithm
- worst case
- experimental evaluation
- cost function
- database
- search space
- preprocessing
- matching algorithm
- mathematical model
- significant improvement
- np hard
- steady state
- learning algorithm
- recognition algorithm
- high speed
- segmentation algorithm
- real time
- databases
- computational cost
- evolutionary algorithm
- optimal solution
- bayesian networks
- genetic algorithm
- neural network