A Classification Approach for an Accurate Analog/RF BIST Evaluation Based on the Process Parameters.
Ahcène BounceurSamia DjemaiBelkacem BrahmiMohand Ouamer BibiReinhardt EulerPublished in: J. Electron. Test. (2018)
Keyphrases
- classification process
- classification accuracy
- classification systems
- classification method
- classification scheme
- accurate classification
- feature extraction
- evaluation process
- pattern recognition
- image classification
- text classification
- process model
- fine tuned
- learning algorithm
- automatic classification
- evaluation method
- classification models
- parameter values
- probability density function
- classification rules
- high accuracy
- feature vectors
- support vector
- decision trees
- feature selection