Temperature dependence of threshold voltage fluctuations in CMOS transistors incorporating halo implant.
Hal EdwardsNiu JinFan-Chi HouLi Jen ChoiTracey KrakowskiKuntal JoardarPublished in: ESSDERC (2014)
Keyphrases
- low voltage
- cmos technology
- electric field
- circuit design
- power consumption
- power supply
- low power
- space charge
- room temperature
- electrical power
- high speed
- low cost
- power system
- high voltage
- power management
- integrated circuit
- image processing
- floating gate
- transmission line
- edge preserving
- threshold selection
- parallel processing
- analog vlsi
- metal oxide semiconductor