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Editorial of the special issue TIAR: Topological image analysis and recognition.
Hepzibah A. Christinal
Fernando Díaz-del-Río
Rebeca Marfil
Helena Molina-Abril
Darian Onchis-Moaca
Pedro Real
Published in:
Pattern Recognit. Lett. (2020)
Keyphrases
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special issue
image analysis and recognition
proceedings of the th international conference
image analysis
ecml pkdd
image recognition
international journal
ai edam
topological properties
applied intelligence
special section
neural network
artificial intelligence
decision making