Defects Recognition on Wafer Maps Using Multilayer Feed-Forward Neural Network.

Radoslav Strba Daniela Bordencea

Published in: EJC (2020)

Keyphrases

feed forward neural networks
back propagation
neural network
multi layer
single layer
feed forward
activation function
feature extraction
pattern recognition
artificial neural networks
search space
fuzzy inference system
evolutionary algorithm
prior knowledge
small number
hidden layer