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Instruction-based March Test Pattern Generation Scheme for At-Speed Test Cost Reduction.

Seokmin ParkGayeong LeeJaehwan ShinSeunghan LeeYoung-woo Lee
Published in: ICAIIC (2023)
Keyphrases
  • cost reduction
  • high speed
  • cost savings
  • multimedia
  • reinforcement learning
  • graphical models
  • lead time
  • post test