Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space.
Shupeng SunXin LiHongzhou LiuKangsheng LuoBen GuPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2015)
Keyphrases
- statistical analysis
- high dimensional
- parameter space
- low dimensional
- higher dimensional
- lower dimensional
- high dimensional spaces
- data points
- search space
- high dimensional data
- high speed
- sparse data
- input space
- principal component analysis
- feature space
- sample size
- noisy data
- dimensionality reduction
- data sets
- sample space
- low dimensional manifolds
- statistical analyses
- embedding space
- random sampling
- high dimensionality
- statistical methods
- event detection
- vector space
- monte carlo
- multi dimensional