Digital Integrated Circuit Testing using Transient Signal Analysis.

James F. Plusquellic Donald M. Chiarulli Steven P. Levitan

Published in: ITC (1996)

Keyphrases

integrated circuit
signal analysis
signal processing
multiresolution
metal oxide semiconductor
empirical mode decomposition
feature extraction
wavelet decomposition
median filter
computer vision
feature selection
image enhancement
independent component analysis
adaptive learning
hardware description language