Lithography-aware layout compaction.

Curtis AndrusMatthew R. Guthaus
Published in: ACM Great Lakes Symposium on VLSI (2012)
Keyphrases
  • cf loadingtexthtml
  • computer science
  • databases
  • neural network
  • database
  • artificial intelligence
  • image processing
  • multimedia
  • case study
  • database systems
  • high quality
  • probability distribution