Novel probability flipping method for ising annealing chip using circuit unreliability.
Zhi WangYang GuoJian ZhangZhao LvPublished in: Microelectron. J. (2020)
Keyphrases
- high speed
- probabilistic model
- high accuracy
- computational cost
- support vector machine svm
- pairwise
- classification method
- synthetic data
- experimental evaluation
- simulated annealing
- cross entropy
- feature extraction
- high precision
- detection method
- clustering method
- em algorithm
- probability distribution
- dynamic programming
- significant improvement
- evolutionary algorithm
- lower bound
- objective function