Login / Signup

ESD-Protected Power Amplifier Design in CMOS for Highly Reliable RF ICs.

Xin WangXiaokang GuanSiqiang FanHe TangHui ZhaoLin LinQiang FangJian LiuAlbert Z. WangLiwu Yang
Published in: IEEE Trans. Ind. Electron. (2011)
Keyphrases
  • highly reliable
  • power consumption
  • circuit design
  • building blocks
  • engineering design
  • low power
  • case study
  • expert systems
  • user interface
  • low cost
  • end to end
  • design principles
  • design tools
  • single chip