Login / Signup

Simulation Study of III-V Lateral Tunnel FETs with Gate-Drain Underlap.

Venkata Appa Rao YempadaSrivatsava Jandhyala
Published in: VDAT (2019)
Keyphrases
  • simulation study
  • monte carlo
  • high speed
  • early warning
  • preprocessing
  • genetic algorithm
  • artificial intelligence
  • data streams
  • image retrieval
  • artificial neural networks
  • simulation model
  • nano scale