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Transconductance/drain current based sensitivity analysis for analog CMOS integrated circuits.

Jack OuPietro M. Ferreira
Published in: NEWCAS (2013)
Keyphrases
  • integrated circuit
  • sensitivity analysis
  • analog vlsi
  • managerial insights
  • metal oxide semiconductor
  • circuit design
  • influence diagrams
  • variational inequalities
  • cmos image sensor
  • high speed
  • decision problems