Infrared detector fault classification and prediction technology based on sensitive parameter learning.
Linlin ShiPeiliang YangPengfei YuCanxiong LaiZhenwei ZhouDanni HongPublished in: ACAI (2022)
Keyphrases
- infrared
- parameter learning
- statistical learning
- infrared imagery
- infrared image sequences
- infrared images
- multi sensor
- hyperspectral
- bayesian networks
- target detection
- thermal infrared
- structure learning
- model selection
- target detection and tracking
- conditional random fields
- thermal imaging
- visible spectrum
- feature selection
- maximum likelihood
- feature extraction
- training set
- supervised learning
- approximate inference
- pairwise
- computer vision
- information theory
- em algorithm