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Soft Errors Sensitivity of SRAM Cells in Hold, Write, Read and Half-Selected Conditions.

Cleiton Magano MarquesCristina MeinhardtPaulo Francisco Butzen
Published in: J. Electron. Test. (2021)
Keyphrases
  • grid cells
  • read write
  • sufficient conditions
  • power consumption
  • sensitivity analysis
  • hard disk
  • database
  • disk drives
  • error analysis
  • randomly selected
  • experimental conditions