Detection of Electronic Devices in real images using Deep Learning Techniques.
Krijeshan GRaghul PNachiappan N. NA. BeulahR. PriyadharshiniPublished in: ICCCSP (2021)
Keyphrases
- deep learning
- electronic devices
- image database
- input image
- test images
- image classification
- machine learning
- image features
- multiple images
- lighting conditions
- unsupervised learning
- object recognition
- segmentation algorithm
- image regions
- image retrieval
- bounding box
- unsupervised feature learning
- partial occlusion
- object detection
- pattern recognition
- feature extraction
- image segmentation