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Multiple degradation mode analysis via gated recurrent unit mode recognizer and life predictors for complex equipment.

Qinyuan LuoYuanhong ChangJinglong ChenHongjie JingHaixin LvTongyang Pan
Published in: Comput. Ind. (2020)
Keyphrases
  • complex systems
  • high level
  • data sets
  • statistical analysis
  • machine learning
  • case study
  • data analysis
  • hidden markov models
  • real world
  • image processing
  • higher level