Estimating component-defect probability from masked system success/failure data.
Benjamin ReiserBetty J. FlehingerAndrew R. ConnPublished in: IEEE Trans. Reliab. (1996)
Keyphrases
- data analysis
- raw data
- data collection
- small number
- data sets
- complex data
- data processing
- image data
- probability distribution
- database
- input data
- data points
- data quality
- original data
- experimental data
- application domains
- sensor data
- synthetic data
- statistical analysis
- prior knowledge
- data sources
- high dimensional data
- spatial data
- query processing
- high quality
- end users
- knowledge discovery
- historical data